Used AMAT / APPLIED MATERIALS Complus 2T #9266645 for sale

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AMAT / APPLIED MATERIALS Complus 2T
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ID: 9266645
Inspection system.
AMAT / APPLIED MATERIALS Complus 2T Mask and Wafer Inspection Equipment is an advanced inspection system used by semiconductor manufacturers for the inspection of masks and wafers. The unit uses a combination of Brightfield and Darkfield optics to detect defects in either alignment and exposure parameters. AMAT Complus 2T has large speed capability, scanning up to 4000 wafers per hour, and offers high-mag resolution, up to 500X, enabling users to provide fast, accurate defect and image analysis. The machine uses high-resolution image sensors and real-time autofocus systems to capture images of 1 micron and less in size, helping users quickly identify defects and dimension variances in their products. The software offers several features, such as image stitching and zooming, to allow users to accurately analyze defects in higher detail. APPLIED MATERIALS Complus 2T also includes illumination intensity control, which allows users to adjust the intensity of the light to achieve optimal image clarity. Complus 2T can detect defects caused by alignment and exposure errors by utilizing its advanced edge detection algorithms. These algorithms can detect various localized and global defects, helping users identify defects that are not easily visible. The tool can be used with both mask and wafer products, and can run both wafer-level and single-die inspections, helping users find hidden defects prior to production of the finished product. AMAT / APPLIED MATERIALS Complus 2T also offers a range of options for data analysis. Users can easily export images and data to a variety of external software packages for further analysis, helping to speed up the overall process. The asset is also capable of sorting, screening and analyzing data, helping users quickly pinpoint specific defect sources and allowing them to set up corrective actions. AMAT Complus 2T is an advanced tool for the inspection of masks and wafers, and can be used to detect a wide variety of defects at the nanometer scale. With its advanced features, high-speed processing, and versatile data analysis capabilities, APPLIED MATERIALS Complus 2T has become an important tool for manufacturers of advanced electronic components.
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