Used AMAT / APPLIED MATERIALS Complus 3T #9266644 for sale

AMAT / APPLIED MATERIALS Complus 3T is a high performance mask and wafer inspection equipment that delivers rapid, accurate, and repeatable inspection results. The system can quickly detect defects in semiconductor masks and wafers with a minimum of false alarms. It features Advanced Edge Detection and Sub-Pixel Edge Detection technologies, which can identify faint features and complex geometries, such as lines and spaces with 1X resolution. This results in very accurate patterned defects inspection, with high-throughput and yield improvements. The unit is based on the tried and true Manufacturing Grade Inspection (MGI) technology, which is widely used in the semiconductor industry. AMAT Complus 3T user experience is further enhanced by an intuitive user interface which is easy to navigate and to operate. The machine can be quickly setup, with parameters easily adjustable to accommodate different masks and wafer designs. This, in combination with its global optimization feature, allows for fast and efficient defect analysis and reporting. APPLIED MATERIALS Complus 3T mask and wafer inspection tool can provide comprehensive non-destructive inspection coverage of the devices. Its advanced aperture array technology is capable of automatically selecting the best inspection resolution and exposure settings for the highest quality image acquisition. Its pre-processing capability is robust, allowing for the extraction and classification of both bright and dark field defects, ensuring the swift detection of potential issues and providing reliable wafer certifications. The asset features an array of fully automated model features for fault detection and classification, and excellent error reporting. Its parallel inspection architecture allows for very fast data collection and analysis, and its versatile interface connectivity allows for easy connection with external databases, data sources and networks. Complus 3T is one of the most versatile and accurate mask and wafer inspection systems in the market, and is tailored for production level quality and defection control. Its speed and accuracy combined with intuitive user interface, extensive automation and powerful image processing capabilities, make it a must-have tool for any production line looking to achieve high yields of defect-free products.