Used AMAT / APPLIED MATERIALS Complus MP #293704418 for sale

AMAT / APPLIED MATERIALS Complus MP is an advanced mask and wafer inspection equipment designed to meet the demands of high volume semiconductor production. It is capable of inspecting small pitches, fine line circuits, and large flat panel displays with high resolution and sensitivity. The system utilizes a "phase-shifting moire" unit that can detect defects as small as 0.2 µm and create high-resolution images. It is also capable of detecting layer misalignments and other tolerances. This data is then used to detect and mark out offending areas of the wafer for reject or repaire. AMAT Complus MP is the first and the only phase-shifting moire machine to achieve 99.99% detection accuracy of small defects on 300mm wafers. Using this tool, a number of research and engineering teams can easily examine and evaluate the structure of various advanced technologies. The inspection asset is designed for extreme accuracy and is capable of detecting defects on ultra low-k materials, metal insulated dielectric interfaces, and ultra thin BARCs. The model's onboard imaging and data analysis software provides quick and easy data capture and analysis, and allows for customization of test parameters to meet the customer's inspection criteria. This makes it suitable for a wide range of inspection and analysis tasks. The equipment also features a flexible system configuration that allows for easy upgrading and customization. The unit also has a high throughput rate and is capable of transferring data at over 500 Mbytes/s. It can transfer data to remote locations through an internet connection in a matter of seconds, allowing for collaboration between engineers and researchers. It also has an extensible user interface that is intuitive and easy to use. APPLIED MATERIALS Complus MP is an advanced die and wafer inspection machine that is well-suited for high volume semiconductor production. It is capable of performing quick and accurate inspections with extreme resolutions and can detect even very small defects. Additionally, it offers a high bandwidth data transfer rate and extensible user interface, making it an ideal solution for several different types of research and engineering tasks.