Used AMAT / APPLIED MATERIALS Complus MP #293769355 for sale
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AMAT Complus Mask & Wafer Inspection Equipment is a high-performance mask and wafer inspection system designed for semiconductor device manufacturing. The unit incorporates a variety of optical and non-optical technologies to provide a comprehensive view of device defects and features, enabling improved process control and device yield. The machine features an integrated mask and wafer inspection module, which includes an optical microscope, automated wafer analysis, CAD-Compare, and X-ray imaging. The optical microscope is a high-power, high-resolution imaging tool that can inspect masks and wafers simultaneously, allowing for an in-depth view of all device features. Automated wafer analysis is used to detect and quantify defects on each wafer, with registration accuracy up to 0.25 micron. CAD-Compare is used for a comparison between the designed and measured feature topographies of the semiconductor device, enabling the device designer to verify the correct manufacturing of their designs. Finally, the X-ray imaging module allows for the identification of physical and electrical defects in each mask and wafer. The asset makes use of a CCD imaging model to acquire images of the masks and wafers and an image digitally generated for each scan. It has an automatic laser alignment capability in both XY and XYZ directions, allowing operators to accurately align the wafer and mask sections for inspection. APPLIED MATERIALS Complus Mask & Wafer Inspection Equipment is capable of collecting data at up to 30,000 pixels per second and has a light field aperture ranging from 0.6 - 20 mm. Additionally, users have the ability to choose between different color palette options in order to view the inspection data in the best way. AMAT / APPLIED MATERIALS Complus Mask & Wafer Inspection System is equipped with a well-rounded collection of software tools and features. These include a superb image processing software, real-time image analysis, and a powerful process analysis tool to identify and assess process related yield losses. Additionally, the unit has automated pattern recognition capabilities, allowing operators to perform detailed inspections at high speeds. In addition to these functions, the machine has a suite of advanced reporting and visualization capabilities. AMAT Complus Mask & Wafer Inspection Tool is essential for semiconductor device manufacturers, as it enables them to identify and address defects along the fabrication process. By providing insights into the physical and electrical aspects of the device, as well as optimized process control and yields, the asset ensures that semiconductor devices are manufactured to specification.
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