Used AMAT / APPLIED MATERIALS Excite #293592125 for sale

ID: 293592125
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AMAT / APPLIED MATERIALS Excite is a state-of-the-art mask and wafer inspection equipment designed to ensure the highest level of accuracy and reliability for mask making, wafer inspection and metrology applications. With its advanced optical and image-processing technologies, AMAT Excite offers fast and reliable detection of critical defects, even on the smallest and most complex devices. APPLIED MATERIALS Excite's high-precision optics are designed to capture extremely fine detail, allowing for the inspection of features in the nanometer range. The system utilizes advanced photomask inspection technology, including an open-frame optical engine, a robotic subsystem, image processing and scanning unit, and the latest in image alignment algorithms. The mask and wafer inspection machine features an advanced embedded vision tool, allowing for the automated mapping of nanometer-level defects and features, ensuring reliable automated inspection. The asset also includes a number of additional features, such as automated exposure and gain control, multi-focus calibration, mask inspection accuracy, and tolerance stackups. It is also capable of performing mask inspection on various substrates, including quartz, sapphire, silicon, among others. In addition, the model can be used for metrology applications and 3D inspection, as well. Excite offers advanced accuracy levels, and is compliant with GDSII and ODSII mask input standards. It is capable of achieving inspection accuracy up to 0.15 microns, with repeatability and linearity of less than 0.1 microns. Additionally, the equipment has an adjustable exposure and gain control that can be adjusted for a variety of substrates and defect locations. Overall, AMAT / APPLIED MATERIALS Excite is an advanced mask and wafer inspection system that offers the highest level of accuracy and reliability. With its advanced optical and image-processing technologies, AMAT Excite offers fast and reliable detection of critical defects, even on the smallest and most complex devices. The unit also has a number of additional features, such as automated exposure and gain control, multi-focus calibration, and mask inspection accuracy, ensuring reliable automated inspection for mask making and wafer inspection applications.
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