Used AMAT / APPLIED MATERIALS Excite #9214619 for sale

ID: 9214619
Vintage: 2001
High speed particle detection system Bare wafer / Patterned wafer inspection 2001 vintage.
AMAT / APPLIED MATERIALS Excite is a mask and wafer inspection equipment designed to provide cost-effective, high-performance lithography solutions for advanced semiconductor manufacturing. The system features a state-of-the-art mask inspection algorithm, combined with powerful hardware and software to provide improved accuracy and reduced false-alarms. The unit's hardware consists of a full-field MEMS-based projection magnifier, a laser interferometer, and a high resolution optical microscope with telecentric illuminator. This powerful combination ensures fast, reliable inspection of the most complex mask and wafer designs. In addition, the machine includes a unique frame synchronization process, which synchronizes the outermost frame of each wafer and mask, eliminating the need to manually adjust the scanning position. The tool's software leverages the hardware capabilities and provides a wide range of features, including advanced defect detection algorithms and statistical algorithms for patterned defects. The asset uses light signal processing to combine image data with profile and signal processing algorithms for inspecting patterns and features down to 50 nanometers in size. The model also offers advanced data management and reporting capabilities, allowing for full traceability of defects and inspection results. AMAT Excite's easy-to-use graphical user interface simplifies the review process, allowing users to quickly and easily identify and analyze defects. This eliminates the need for manual review, which can be time consuming and expensive. APPLIED MATERIALS Excite mask and wafer inspection equipment has earned a reputation for reliability, accuracy and performance, making it a popular choice amongst semiconductor manufacturers. The system provides an excellent foundation for a successful lithography process, and is an effective solution for ensuring high-yield semiconductor production.
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