Used AMAT / APPLIED MATERIALS Opal 9300 #9086218 for sale

ID: 9086218
Wafer Size: 8"
Vintage: 2000
Defect review system, 8" 2000 vintage.
AMAT / APPLIED MATERIALS Opal 9300 is a mask and wafer inspection equipment designed to provide comprehensive mask and wafer defect inspection capabilities. The system is designed to meet the demands of advanced semiconductor device production and next-generation lithography processes. The unit can identify and classify both micro- and macro-compliant defects on wafers. The machine is also capable of image processing and pattern recognition to identify a wide range of wafer defects. The tool utilizes an advanced 4K CCD camera, along with a powerful focus feature to enable the detection of even ultra-small defects. The asset has a high numerical aperture and a 4X binocular optical model to ensure highly accurate image capture and analysis. This is combined with a high-speed image processing equipment, allowing the system to quickly and accurately inspect a wafer or mask surface. The unit is also equipped with a color filter that enables the user to select a certain wavelength for inspection. The machine also features precision wafer alignment and image decoding, along with a host of defect identification and classification algorithms and tools to ensure accurate detection and reporting of defects. The tool also has advanced tools like backside imaging and dark-field imaging to identify defects in the darkest areas of a wafer. The asset also has multiplexing and dual-beam scanning for more accurate inspection and analysis. The model is also designed to reduce the need for manual inspections, with advanced automation capabilities that enable it to integrate into existing high-volume manufacturing processes. The equipment also features an array of calibration and imaging tools, as well as an intuitive user interface, making it easier for users to create and maintain high-precision images. The system also offers a range of data logging and reporting functions, including color-coded defect mapping that can help management quickly identify and address defect trends. Overall, AMAT Opal 9300 is a powerful and highly advanced mask and wafer inspection unit designed to meet the demands of modern semiconductor device production and next-generation lithography processes. The machine is capable of capturing, processing, and analyzing a wide range of mask and wafer defects, using precise imaging technology and algorithms to accurately identify and classify defects. Additionally, the tool is designed to reduce the need for manual inspections and to integrate into existing high-volume production processes, making it an ideal choice for today's advanced semiconductor device manufacturing needs.
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