Used AMAT / APPLIED MATERIALS / ORBOT WF 720 #9097133 for sale

AMAT / APPLIED MATERIALS / ORBOT WF 720
ID: 9097133
Wafer Size: 6"
Vintage: 1997
Wafer inspection system, 6", 1997 vintage.
AMAT / APPLIED MATERIALS / ORBOT WF 720 is a mask and wafer inspection equipment designed for advanced semiconductor inspection and metrology applications. It features a fast and high resolution imaging system, advanced algorithms and advanced optics. Its powerful inspection capabilities allow for accurate, repeatable, and reliable wafer defect detection, enabling the technology to be used in a variety of semiconductor manufacturing processes. The unit consists of a high-power laser illumination source, precision optics, and optics to focus the light. It uses a CCD image sensors array to capture continuous images with sub-pixel resolution. The high-power illumination source provides high resolution imaging and the optics allow the beam to focus on the surface of the mask or wafer. The optics used also enables the machine to measure the distance between adjacent feature elements on the wafer to detect alignment errors. AMAT WF 720 provides advanced automation technology and programmability, enabling automated and repeatable wafer inspection, metrology, and defect detection. The tool also includes advanced software and image processing algorithms to analyze measured data and detect defects in wafers. It has a measurement rate up to 6200 wpm, allowing for high throughput inspections. The asset is equipped with a compact and lightweight chassis designed for quick and easy installation. It is powered by a voltage inverter, which allows for quick and flexible power up/down for maintenance. It also includes a high-speed I/O port to interface with other systems. ORBOT WF 720 offers inspection capabilities for both masks and wafers up to 8-inch diameters, providing high resolution imaging and defect detection. The model is certified and/or compliant with the CE and ISO standards, ensuring best performance in a variety of industrial environments. The device is designed to meet the challenging requirements of semiconductor inspection, making it an ideal tool for high-precision process control.
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