Used AMAT / APPLIED MATERIALS / ORBOT WF-736 XS DUO #293617609 for sale

ID: 293617609
Vintage: 2001
Patterned wafer inspection system 2001 vintage.
AMAT / APPLIED MATERIALS / ORBOT WF-736 XS DUO is a premium mask and wafer inspection equipment designed to meet the stringent requirements of the semiconductor manufacturing industry. AMAT WF-736 XS DUO system allows for simultaneous high-resolution defect inspection and analysis on full-die patterns and cross-sectional structures of up to 200 mm across. The unit uses a dual-beam optics technique to obtain high-resolution images of both transparent and reflective samples. The optics includes an ultraviolet laser, a visible laser and a near-infrared laser in a single-lens configuration. All three illumination sources can be used together or separately to obtain the highest level of accuracy and repeatability. The machine is designed to operate at a wide range of working distances, from 0.1 to 30 mm, with a 500 µm recognition accuracy. The tool also features an advanced image acquisition asset with 18-bit optical resolution, along with digital image processing algorithms to deliver superior level of image analysis and yield improvements. The model is equipped with a parallel image image sensor and a CMOS image sensor for fast image capture and the analysis of complex structures. Furthermore, the equipment is designed with a high-speed defect detection and analysis capability, along with automatic wafer scanning and advanced 3D CAD/netlist generation. It also features an intuitive software interface which allows for easy adjustment of inspection and acquisition parameters and advanced data display options. In conclusion, ORBOT WF-736 XS DUO is one of the most advanced mask and wafer inspection systems available on the market. It offers high performance, incomparable accuracy and a wide range of features to meet all the semiconductor industry's needs.
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