Used AMAT / APPLIED MATERIALS / ORBOT WF-736 XS DUO #9412198 for sale

AMAT / APPLIED MATERIALS / ORBOT WF-736 XS DUO is an advanced mask and wafer inspection equipment. It includes two wafer inspection stations, an advanced computerized vision system, and a powerful interferometric lens unit. The machine is equipped with an advanced optical profiler, wafer inspection station, SEMI auto-adjustment, high-speed auto-focus tool, and a customizable user interface. The first of the two wafer inspection stations feature an 8" optical scan field for capturing the whole inspected wafer surface. AMAT WF-736 XS DUO includes a high-resolution line scan camera, which enables the asset to look at multiple surface features with superior accuracy. The line scan camera works in conjunction with the included optical profiler to acquire high-quality 3D images of defects on the wafer. The second wafer inspection station is equipped with a high-resolution CCD camera to capture large wafer images with great accuracy and detail. The CCD camera is used to capture surface defects of up to 0.2μm. This model also includes a SEMI auto-adjustment feature for automated setup and operation. Along with the two wafer inspection stations, ORBOT WF-736 XS DUO features an advanced computerized vision equipment with a range of customizable features. The computerized vision system offers pattern selection, contour analysis, and rotation analysis capabilities. The unit can also be configured to generate alerts if any of the wafer defects exceed preset parameters. Additionally, the vision machine supports different fields of view and magnification levels, enabling clear visualization of the entire wafer. WF-736 XS DUO is equipped with a powerful interferometric lens tool, providing high-precision imaging with excellent resolution and contrast. The lens focuses a laser spot on the surface of the wafer to acquire 3D images of defects at high speed. The asset's autofocus model keeps the focused spot of the laser centered at all times, ensuring the scanning of wafers is as accurate and efficient as possible. In addition, the equipment includes a customizable user interface, allowing operators to customize functions, tailor system settings, and program automated routines for efficient inspections. The user interface includes real-time navigation of the inspected wafer surface, as well as a library of wafer test images. APPLIED MATERIALS WF-736 XS DUO is one of the most advanced mask and wafer inspection systems available. It offers high-precision imaging and automated operation with a range of customizable features, making it an ideal solution for production environments.