Used AMAT / APPLIED MATERIALS Semvision ADC Server #293642108 for sale

AMAT / APPLIED MATERIALS Semvision ADC Server is a high-performance mask and wafer inspection equipment designed to provide superior resolution and accuracy for imaging and analysis of advanced logic, memory, and analog applications. The system combines two powerful imaging components, the versatile ADC-3D optical profilometer and a state-of-the-art CCD area-scan camera, to create a comprehensive solution for inspecting the smallest details of any patterned structure. At the heart of AMAT Semvision ADC Server is a multi-axis scanning head that allows for precise alignment of the optical profilometer and the imaging camera. This ensures that each image is accurately captured during inspection. The unit is able to inspect extremely small features down to 30 nm as well as complex structures like double-pitch contacts, dummy gates, and polygon shapes. Plus, the machine's quiet operation allows for uninterrupted and undisturbed analysis of the material being inspected. In addition to its imaging capabilities, APPLIED MATERIALS Semvision ADC Server also offers a suite of powerful software programs that are designed to facilitate pattern recognition and identification. These include automated defect identification and classification, process defect analysis, and trend diagnostics. Other functions such as lithographic replotting, volume calculation, and advanced feature detection are also available through the software. The user interface of the tool is also highly customizable, allowing users to easily select the appropriate parameters and criteria for the task at hand. The intuitive interface is designed to make data analysis quicker and more efficient. In sum, Semvision ADC Server is an ideal solution for those in need of a reliable, high-performance mask and wafer inspection asset. With its remarkable image capture and advanced software tools, AMAT / APPLIED MATERIALS Semvision ADC Server is well-suited for inspecting the smallest features and for quickly and accurately identifying defects during treatment.