Used AMAT / APPLIED MATERIALS Semvision ADC Server #9147377 for sale

AMAT / APPLIED MATERIALS Semvision ADC Server is an automated mask and wafer inspection equipment designed to enable mask designers and lithographers to quickly and accurately analyze data extraction, layout comparison, and image processing. It's an efficient solution for rapid yielding of mask and wafer fabrication. This system focuses on production process control with a comprehensive suite of applications. It provides user-friendliness, automated analysis, and repeatable data for internal and external specifications. It comes with a selection of standard and custom-designed software tools for a variety of mask and wafer data analysis tasks. These tools include data extraction, layout comparison, image processing, defect and vulnerability detection, and even custom scripting capabilities for specialized work. The unit ships with a range of intuitive visualizers for data representation. Through its powerful drawing capabilities, users can instantly visualize process-generated data to gain insights into areas of improvement. This paper-to-fab data extraction takes a single signal from the design data and translates it into a full-fledged image. This is especially useful in the debugging and review of wafer characteristics. The machine's automated analysis features allow users to perform detailed inspections and find defects on individual wafers. This helps further increase overall production yields. The automated analysis also provides a set of graphical trace-rounding algorithms to identify and isolate wafer patterns from the processed data. Its sophisticated and agile pattern recognition capabilities help save time spent performing tedious manual tasks. The automated image processing capabilities allow users to view, edit, and analyze the image. It includes tools such as noise reduction, geometric transforms, and edge linking to enhance the quality of the image. AMAT Semvision ADC Server's defect detection feature provides rapid detection of any issues a wafer or mask may have. It offers integration with process control systems to give users the ability to quickly identify anomalies and defective areas. This integration of process control analysis enhances traceability and ability to identify defects amid wafer images and suspicious areas on the mask without having to manually look for defects. Overall, APPLIED MATERIALS Semvision ADC Server is an efficient, automated mask and wafer inspection tool for accelerating production yields. It features intuitive data visualizers, powerful drawing and editing capabilities, automated process control, and efficient traceability. This asset provides mask and wafer designers and lithographers with an intuitive and versatile platform to ensure high-quality inspection and detection activities.