Used AMAT / APPLIED MATERIALS SemVision CX 200 #9232656 for sale

ID: 9232656
Defect review system.
AMAT / APPLIED MATERIALS SemVision CX 200 is a powerful image-based mask and wafer inspection equipment that allows manufacturers to quickly and accurately detect defects in a wide range of substrates. The system's state-of-the-art optics and imaging systems are complemented by advanced algorithms and proprietary hardware and software to deliver fast, accurate results. AMAT SemVision CX 200 utilizes both UV-Vis-NIR (ultraviolet-visible-near infrared) illumination and imaging for its mask and wafer inspections. With its narrow field of view, the unit takes high-resolution images of very small areas that can be quickly and accurately assessed for yield and defects. The images are taken from multiple angles to produce an accurate representation of the material's structure and any defects it may contain. The machine is then able to quickly analyze the images to detect even the smallest defects. In addition to its imaging capabilities, APPLIED MATERIALS SemVision CX 200 has a variety of features that help make it an efficient and effective inspection tool. For example, the asset has an integrated automatic focus, adjustable illumination, user-friendly file management, and the ability to detect defects down to 2μm. It also has a variety of automated processes that can be adjusted based on the material being inspected. This helps minimize operator intervention and ensure consistent and accurate results. SemVision CX 200's flexible design makes it ideal for installations in different production environments. Its intuitive user interface and adjustable parameters make it simple to adjust the model for different environments and applications. Plus, the integration of the materials libraries allows users to easily access previously stored libraries or design new ones quickly. Overall, AMAT / APPLIED MATERIALS SemVision CX 200 is a state-of-the-art mask and wafer inspection equipment that enables manufacturers to quickly and accurately detect defects in a wide range of substrates. With its UV-Vis-NIR imaging, adjustable illumination, predictable analysis algorithms, automated processes, and intuitive interface, AMAT SemVision CX 200 presents an ideal solution for manufacturers who need fast and accurate results.
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