Used AMAT / APPLIED MATERIALS SemVision CX 300 #293628469 for sale

AMAT / APPLIED MATERIALS SemVision CX 300 is a mask and wafer inspection equipment for semiconductor applications. It is a reliable, high-speed system that has been designed to swiftly and accurately inspect semiconductor masks and wafers tailored for advanced process nodes. The unit offers full-field in-line inspection of photomasks, wafers, and micro-devices with unprecedented accuracy and speed. This inspection machine achieves high throughput due to its powerful optics and extraordinary illumination power. The unit is designed to control beam size, frequency, and shape on a wafer or mask to different depths so that it can collect and evaluate data to ensure quality of the product. The CX 300 can detect a variety of critical defects such as point defects, line edge roughness, residual particle, line width errors, etc., to deliver accurate results. The CX 300 is capable of detecting the smallest and most challenging defects across the entire wafer. It can inspect wafers up to 32x32 cm substrate size and up to 1mm thick. The tool also supports a variety of substrates such as silicon, sapphire, quartz, glass, etc. The CX 300 supports several advanced optics including digital holographic microscopy, variable depth imaging, wafer-to-wafer metrology, and digital imaging to provide detailed analysis of defects. Additionally, it is equipped with a large selection of illumination components and advanced lighting conditions, including an optional master illumination asset, which ensures more accurate imaging results. The CX 300 comes with an intuitive software platform that allows users to easily navigate, control, and analyze data collected by the unit with no need for training. It has an advanced automated defect review software, which can quickly detect, measure, and classify defects. The software can also be used to generate CAD-like objects and to analyze surrounding structural aberration (SSA) of CD changes. Overall, AMAT SemVision CX 300 is an advanced mask and wafer inspection model designed to provide fast and high-precision results. It can help inspection of the highest quality, complex devices and its software capabilities provide user-friendly and intuitive operation which makes the unit a reliable tool for semiconductor manufacturing.