Used AMAT / APPLIED MATERIALS SemVision CX-DR #9172574 for sale
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ID: 9172574
Wafer Size: 8"
Vintage: 2000
Defect review system, 8"
EDS Capability
Image tilt capability
ADR (Auto defect review) capability
Inspection type: Optical
System:
Mainframe
Operator console
Component FFU
Pump rack
Pump 1&2
EDX Compressor
EPDU Interconnect cables
IP Hard drive
Octane hard drive
High current column liner installed (250p-amp)
80μm Liner tube
Image processor:
2.4 GHz
1400x1400 Pixels
Improved cooling
HVU-ELS Option (FOCI)
SECS II / GEM Communication interface
Side and top detectors
EDWARDS E2M80, E2M40 pumps
Voltage: 208 volts
Frequency: 50/60 hertz
Phase: 3+1
Current: 40A
2000 vintage.
AMAT / APPLIED MATERIALS SemVision CX-DR is an advanced mask and wafer inspection equipment. It is designed to address the challenging demands seen in today's demanding semiconductor packaging and inspection applications. This system integrates with AMAT renowned Prober™ Platform, offering unmatched levels of automation and speed. AMAT SemVision CX-DR provides an automated, complete solution for mask and wafer inspection, utilizing a combination of advanced optics, high-resolution imaging, pattern recognition and powerful software to achieve higher levels of accuracy. The unit is capable of detecting particles and blemishes on the wafer surface, as well as uncovering anomaly defects on the mask surface. This is made possible through the machine's automated defect review (DR) technology, which uses a combination of four optical techniques: CCD imaging, interference technology, back-side fluorescence imaging and an automated surface measurement technique. This technology also allows for automatic defect classification, which can accurately sort and categorize any surface anomalies. In addition to its defect detection capabilities, APPLIED MATERIALS SemVision CX-DR also includes a number of intelligent features to ensure quicker, more accurate results. These features include automatic inspection calibration, a unique algorithm that can detect over-under exposure and a prober error capture tool. This error capture asset is able to detect any potential errors in the probe process, helping to ensure the highest yield in wafer testing. SemVision CX-DR is designed with a user-friendly interface. An intuitive graphical user interface (GUI) allows the user to quickly and easily set up the model, with preset configurations already available to speed up the setup process. The graphic display is touch-enabled, meaning that the user can customize their inspection display to best fit their individual needs with ease. Overall, AMAT / APPLIED MATERIALS SemVision CX-DR is an innovative and comprehensive wafer and mask inspection equipment designed to provide unparalleled accuracy and speed. The system's combination of advanced optics, high-resolution imaging, pattern recognition, and powerful software capabilities makes it one of the most sought-after mask and wafer inspection systems available.
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