Used AMAT / APPLIED MATERIALS SemVision CX Plus #9205642 for sale

AMAT / APPLIED MATERIALS SemVision CX Plus is a mask and wafer inspection equipment designed for use in the semiconductor industry. The advanced system features an Ellipsometer, a Surface Inspection Module (SIM), and a robust integrated software package. The advanced unit provides HD resolution, wafer contouring and verification, numerous measurement capabilities, and low cost of ownership. The Ellipsometer is designed to monitor the material layers of a wafer with great precision. It uses both single- and multi-spectral polarization to analyze the wafer. The machine is capable of inspecting layers of up to 30nm with a resolution of 1nm. This Ellipsometer also supports low-temperature measurement modes for photoresist and dielectric materials. The Surface Inspection Module (SIM) allows for the detailed analysis of surface topography, contamination, stress, and more. The 9.1 megapixel CCD camera included enables high resolution imaging, capturing the smallest defects in wafers. Furthermore, the SIM is capable of using 3D imaging technology to quickly acquire surface profiles that can be used to monitor device performance. The CX Plus integrates a powerful software package. The software provides easy access to all of the features of the hardware, including the ability to manage multiple wafers at once and a powerful optimization tool that helps maximize the inspection tool's accuracy. AMAT SemVision CX Plus is an advanced mask and wafer inspection asset designed for use in the semiconductor industry. The model features an Ellipsometer and a Surface Inspection Module with a 9.1 megapixel CCD camera. The equipment is capable of inspecting layers of up to 30nm with a resolution of 1nm, and can detect the smallest defects in wafers. The CX Plus also features an integrated software package that provides easy access to all of the hardware features, and includes a powerful optimization tool to maximize accuracy.