Used AMAT / APPLIED MATERIALS SemVision CX #9227401 for sale

AMAT / APPLIED MATERIALS SemVision CX
ID: 9227401
Wafer Size: 8"
SEM Review station, 8".
AMAT / APPLIED MATERIALS SemVision CX is a wafer and mask inspection equipment designed for the production of advanced semiconductor devices. Its primary focus is on obtaining high-yield images and ultimately higher yields through the prevention of yield-inhibiting defects. The system can detect fabrication defects, such as particle contamination, scratches, chipping, and pattern deviations. The unit is designed to improve product quality and yield by ensuring robust pattern-dimensional accuracy in all product categories, from devices to logic circuits. The machine utilizes an advanced digital imaging mapping technology to detect subtle defects that are invisible to the human eye. The tool also supports automated error correction and replacement of defective masks without requiring any manual intervention. The asset has multiple inspection resolutions, from coarse to ultra-fine, providing superior detail and precision for different applications. The model also supports a wide range of compatible inspections for a number of standard and advanced materials, such as copper, aluminum, photoresist, tungsten, and opaque materials. Its imaging technology is ideal for inspecting new generations of design-intensive materials. The equipment is also capable of multi-layer inspection, meaning users can review entire layers of a device in one pass. This can significantly improve process efficiency. Physically, AMAT SemVision CX is compact and includes a 6-inch XY substrate stage with a 5-axis motorized stage, a manual wheeled monitor, and a 0.25-inch chromatic steel frame with Teflon bearings. This allows for automated scanning of the device during production. The system also includes an advanced optics package with a semi-confocal optics unit, high-accuracy imaging optics, high-accuracy wafer image stigmator for collimating incident light, and an advanced- no-light imaging machine for automated defect detection. In summary, APPLIED MATERIALS SEM VISION CX is a highly advanced mask and wafer inspection tool featuring automated error correction and replacement of defective masks, imaging technology suitable for inspecting new generations of design-intensive materials, and an advanced optics package for high-accuracy image acquisition. This asset can help to improve production yield and product quality, ultimately leading to cost savings and a more efficient production process.
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