Used AMAT / APPLIED MATERIALS SemVision G2 #9215407 for sale
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ID: 9215407
Vintage: 2003
Defect review system, parts machine
Includes:
Main body
Controller rack
Missing parts in controller rack:
PCB
Power supply
Computer
2003 vintage.
AMAT / APPLIED MATERIALS SemVision G2 is an automated mask and wafer inspection equipment designed with the latest advancements in inspection technology. It takes a three-dimensional image of the microchip at high resolution and can quickly identify potential defects and areas of inefficiency. The inspection process begins with the wafer spinning rapidly on an electronically controlled platform. An infrared camera then takes more than 6,000 frames of the spinning wafer. This data is then analysed and interpreted by the system's powerful AI algorithms, allowing for a highly accurate rendering of its components and areas of potential weakness. The AI software can then easily locate errors and inconsistencies in the structure, each of which can then be inspected and repaired if necessary. Depending on the customer's requirements, the unit's parameters can be adjusted to inspect at different resolutions and depths. The G2 also supports a wide variety of different wafer sizes, making it suitable for any industry or technology. The G2's modern design ensures high levels of process efficiency and includes full automation, giving users the flexibility to automate all inspections that are performed. The integrated software is capable of handling multiple wafers in an efficient manner and can perform several different inspections on each wafer. Its image navigation machine also allows users to quickly locate and review images of potential defects in the wafer, improving the overall process. By utilizing its masking, alignment, and defect features, AMAT SemVision G2 can help minimize defects and substantially reduce the stress on production teams. Thanks to its integration of the latest AI technology and automated features, APPLIED MATERIALS SemVision G2 is the perfect tool for efficiently inspecting both masks and wafers and quickly identifying defects and inefficiencies. It offers a high degree of accuracy, flexibility and can perform multiple inspections to ensure that end-products will meet the customer's expectations and specifications. The tool has proven itself to be a valuable asset in the constantly evolving semiconductor industry and is one of the most reliable inspection solutions on the market.
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