Used AMAT / APPLIED MATERIALS SemVision G2 #9227745 for sale
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ID: 9227745
Vintage: 2004
System
Missing parts:
All hard drives
EDX System:
Cooling head
Detector
Compressor
Gas lines
DPP
Vantage work stage
ELS - G2
CDM – SPGU
IP Odyssey imaging boards
Stage controller: XY Encoder board
Isolation block
2004 vintage.
AMAT / APPLIED MATERIALS SemVision G2 is a powerful mask and wafer inspection equipment designed to provide highly accurate and rapid defect detection and characterization. The system is equipped with the latest inspection technologies, allowing for fast and efficient defect detection and location with high precision for production-level semiconductor component inspection. AMAT SemVision G2 features an aberration-corrected 4.5kV scanning electron microscope (SEM) integrated with state-of-the-art image acquisition and imaging processing technologies. It is engineered to deliver superior imaging performance and analysis for complex defects. The unit utilizes advanced detectors such as a four-channel signal detection, a high sensitivity tilt detector, and amplitude contrast technology for superior contrast resolution, providing superior imaging fidelity, repeatability, and reliability. APPLIED MATERIALS SemVision G2 also features a high throughput wafer review mode that allows users to efficiently screen and classify wafers in production volumes. In addition to imaging capabilities, SemVision G2 is equipped with a 3D auto-alignment machine that enables rapid auto-alignment of the sample, image rotation, and tilt detection. It also allows users to perform 3D x-ray analysis in both top-down and side-view orientation. With integrated image analysis applications, defects can be accurately sized and classified with ease. Moreover, the tool is designed with multi-user access, so multiple users can use the asset simultaneously, enabling increased productivity and shorter cycle times. AMAT / APPLIED MATERIALS SemVision G2 offers a combination of advanced imaging and analysis capabilities at an affordable price, making it an ideal tool for semiconductor component inspection. Integrated hardware and software technologies provide superior image resolution and contrast for fast and accurate defect analysis. With 3D auto-alignment, multi-user access, and flexible image processing, the model is designed to meet the demanding inspection requirements of the semiconductor industry.
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