Used AMAT / APPLIED MATERIALS SemVision G3 FIB #9264196 for sale

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AMAT / APPLIED MATERIALS SemVision G3 FIB
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ID: 9264196
Wafer Size: 12"
Defect review system, 12".
AMAT / APPLIED MATERIALS SemVision G3 FIB (focused ion beam) is a comprehensive mask and wafer inspection equipment. This system uses proprietary optical and scanning electron microscopy (SEM) technology to provide leading-edge wafer, mask and other flat sample surface metrology inspection capabilities. Highlights of SemVision G3 include: Superior imaging capabilities and defect localization. The advanced SEM imaging enables detailed imaging and defect localization, helping to ensure accurate assessment of critical structures and defects across a broad range of structures. Comprehensive Defect Classification. The unit offers comprehensive defect classification for wafers, masks and other flat samples, providing reliable detection and classification of particles, contaminants and structural defects.Machine Control. SemVision G3 offers tool control with advanced software and user programming interfaces, allowing for automated throughput and efficient utilization of the asset. Automated Indexing and Defect Sorting. Automated indexing and defect sorting capabilities, which allow for fast pattern recognition, offer great insight into the defect process. This helps to provide superior fault coring capabilities at single shot analysis time. Integration with AMAT and Third-Party Software. SemVision G3 is capable of integrating with other APPLIED MATERIALS and third-party software, allowing for cost-effective data analysis and quick product validation. Global Support. The model comes with a comprehensive global support network, including Installation, Training and Technical Support. This helps users maximize their performance and minimize downtime. In conclusion, AMAT SemVision G3 FIB is a highly advanced mask and wafer inspection equipment that provides superior imaging and defect localization capabilities, comprehensive defect classification, automated indexing and defect sorting, and supports integration with other AMAT / APPLIED MATERIALS and third-party software. The system also comes with an excellent global support network for maximum performance and minimal downtime.
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