Used AMAT / APPLIED MATERIALS SemVision G3 FIB #9287513 for sale

AMAT / APPLIED MATERIALS SemVision G3 FIB is a mask and wafer inspection equipment designed for resolving design errors at the wafer level. Featuring both high-resolution imaging and inspection capabilities, the system is capable of detecting defects as small as 2nm on a 350nm pitch. This unit is suitable for both engineering process control and production data analysis. In terms of specifications, AMAT SemVision G3 FIB utilizes an Ultima FIB/SEM column and advanced imaging technologies like Resolution Targeting Automation software, Optical Proximal Probing, and TEM/SEM capabilities for highest accuracy, flexibility, and throughput. It comes loaded with the latest imaging and analysis tools, including defect review, area scrupulousness, and imaging fidelity modules. This machine is equipped with a unique dual stage Automation Scanning and Inspection Software (ASIS) board, which allows integration of several scanning environments. This feature ensures optimal performance in terms of production speed and yield optimization. Additionally, an 820 Integrex FE-SEM motorized centering device offers increased positioning accuracy, improved throughput, and versatility. APPLIED MATERIALS SemVision G3 FIB is a versatile platform as it allows easy integration of other third-party inspection products. As a result, you can use it to perform several functions like automation alignment, programmable staging, defect pre-processing, and fast single-image alignment. As for sample size, the tool can process up to a 4-inch wafer. SemVision G3 FIB is designed for safe operation and offers field-based safety options, such as interlocks, auto-stop, contamination monitoring, and auto alarms for easier maintenance and management of wafer processing. Its ergonomic design makes it convenient and easy to use. The asset comes with a touch screen panel and a user-friendly GUI which help to navigate various interactive features. Overall, AMAT / APPLIED MATERIALS SemVision G3 FIB is an advanced and reliable solution for wafer inspection tasks. It offers improved accuracy, productivity, and flexibility and is suitable for automated process control and data analysis.