Used AMAT / APPLIED MATERIALS SemVision G3 Lite #293626936 for sale

AMAT / APPLIED MATERIALS SemVision G3 Lite is a top of the line semiconductor mask and wafer inspection equipment designed to streamline production and increase throughput. Using a combination of high-resolution digital imaging and advanced data analysis, the G3 Lite is able to quickly identify flaws and defects on semiconductor masks and wafers. The G3 Lite's imaging system is fully customizable to meet the highest quality standards. It utilizes a variety of magnification levels, from 10× to 13,500×, allowing for more detailed and accurate inspection. A full-size CCD optical array is capable of capturing images up to 6k x 6k resolution in the inspection area, giving the unit the capability to detect extremely small defects. Computerized image manipulation and advanced image processing algorithms further enhance the machine's capabilities. Designed for maximum throughput and productivity, the G3 Lite features an adjustable scanning speed, allowing operators to adjust the scan rate to meet their application requirements. The machine supports both 100 nanometer and 300 nanometer imaging, allowing operators to quickly switch between different inspections and processes. In addition, the tool has an automated stage which can move, tilt, and rotate all major levels of wafer production with precision. The G3 Lite features a comprehensive suite of analysis tools, allowing operators to measure and analyze patterns, edges, and dimensions with extreme accuracy. Auto-Focus and Auto-Tune technologies help reduce inspection times while maintaining accuracy levels, allowing the asset to quickly identify potential defects. The user-friendly graphical interface ensures that operators can quickly learn how to use the model. The equipment also includes a robust range of reporting and data output options, including plotters, digitizers, and laser printers. The versatile G3 Lite system is suitable for a wide range of applications, from high-volume production to laboratory-level research. Its combination of high performance and advanced features makes it an excellent choice for any mask or wafer inspection operation.