Used AMAT / APPLIED MATERIALS SemVision G3 Lite #293821128 for sale

AMAT / APPLIED MATERIALS SemVision G3 Lite is a mask and wafer inspection equipment used to detect defects in semiconductor chips and integrated circuits. It consists of a high resolution imaging stage, combined with precise illumination and advanced optical imaging technologies. The system can be used to inspect wafer sizes ranging from 200mm to 300mm with a resolution of up to 0.1 microns. The unit uses a CCD imaging technology which works by capturing each individual semiconductor structure and its location on the wafer. The machine then uses algorithms to compare the shape of the features to a defect-free template and compare it with a previously accepted kernal or acceptable semiconductor rules for its performance. A camera is mounted on a precise navigation stage directly over the wafer. The imaged wafer is illuminated with a set of LEDs, which precisely control the illumination intensity, direction and polarization. This light augments the patterns of each individual structure and helps to define details which are too small for the naked eye to see. The light also serves to reveal defects, integrated circuits and other features, as well as to enhance contrast in identifying defects that may be present. The imaging tool allows simultaneous high speed imaging and enhancement, and integration of high and low contrast information in order to detect optical signatures of potential defects. The asset is controlled by a multi-user, multi-task graphical user interface. This allows multiple users to access the model and run concurrent jobs. It is possible to save saved and analyzed jobs to a file format which can be used by other AMAT software applications. The equipment also has customizable tools and processes, as well as an extensive library of optical filters, algorithms and recipes. The system is capable of automatically detecting pattern topology and defects, as well as multi-pattern mask analysis, process instability analysis and non-visual compound flow analysis. Overall, AMAT SemVision G3 Lite is a powerful tool for identifying and examining defects in integrated circuits and semiconductor chips. It combines precision imaging, advanced optical technology and sophisticated algorithms to offer a reliable way of ensuring the quality of these complex components.