Used AMAT / APPLIED MATERIALS SemVision G3 Lite #9287515 for sale

AMAT / APPLIED MATERIALS SemVision G3 Lite is a mask and wafer inspection equipment designed to facilitate the reliable and efficient inspection of high-end microelectronic devices. The system utilizes features such as high-resolution quasiparticle imaging, light-field optics and a unique pattern recognition module to provide superior defect detection and reporting capabilities. AMAT SemVision G3 Lite is equipped with advanced color LED lighting, enabling the unit to accurately measure pattern differences in both illuminated and un-illuminated samples, enabling users to inspect a wider range of materials. It also features a scintillating screen projection that displays 150nm resolution images of the specimen, providing users with detailed images to aid in the detection of sub-micron defects. The machine's auto-measurement feature uses a variety of pattern analysis techniques to detect shape, size and grey-level features, which enable users to quickly and accurately measure the characteristics of each feature. The unique auto-measurement feature can also be used to identify possible defects, or changes in patterns, thereby providing users with feedback on the potential causes of the defect. APPLIED MATERIALS SemVision G3 Lite is also equipped with a high-speed imaging module, providing users with 2.5 Gigapixel/second imaging throughput. Using this imaging module, users can quickly acquire images from up to 10 samples at once with a minimum field-of-view of 150nm. Additionally, the module is capable of imaging an entire wafer in less than one second. The tool also provides users with various analysis tools such as mask alignment and transistor imaging, enabling users to accurately identify and classify defects. With the aid of its powerful analyzing capabilities, SemVision G3 Lite also provides users with a variety of useful data such as critical shapes, feature sizes, and grey-level information. Overall, AMAT / APPLIED MATERIALS SemVision G3 Lite is an advanced mask and wafer inspection asset with a wide range of features and capabilities, making it an ideal tool for inspecting high-end microelectronic chips and other complex devices. With its highly advanced imaging capabilities, powerful analyzing features, and fast image acquisition speed, AMAT SemVision G3 Lite is a powerful and reliable tool for inspecting devices of any size and complexity.