Used AMAT / APPLIED MATERIALS SemVision G3 Lite #9382818 for sale

AMAT / APPLIED MATERIALS SemVision G3 Lite is a mask and wafer inspection equipment that provides automated, high resolution inspection of photomasks, microelectronic devices and displays. The system is an ideal choice for analyzing critical defects that are difficult to detect with standard optical inspection systems. The unit features an automated, high resolution imaging machine with an 10X rotary motion stage covering a viewing area of up to 600mm x 600mm. The tool also features a high speed digital signal processor which allows for rapid inspection of multiple parts in a short amount of time. The optics incorporate an optical microscope with an adjustable focus base. The adjustable base allows for a depth of field adjustment and is also equipped with a motorized synchronous stepping mechanism for accurate stage movement. The asset's Image Processing Software suite provides a highly reliable and accurate detection of defects such as particle contamination, scratches, pinholes, variations in film thickness and other types of defects. The software also incorporates image analysis techniques such as pattern recognition, clustering and dimension measurement. The software integrates with a Triad MEA platform for rapid image capture and analysis. The model also includes a mouse interface that controls stage movements, zoom and focus. Operators can also access a remote web-based application to manage the equipment, monitor real-time performance, update parameters and review and export captured images. The system's advanced measurement, accuracy and performance capabilities make it ideal for use in semiconductor, FPD and photomask production environments. In addition, the unit can be used in research or development of new processes and materials as well as quality control, wafer inspection and dielectric layer inspection.