Used AMAT / APPLIED MATERIALS SemVision G3 #9072082 for sale

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ID: 9072082
Wafer Size: 12"
Vintage: 2005
Defect review system, 12" (2) Loadports with FOUP capable (TDK) RFID Type: Loadports carrier reader BROOKS Robot Light source: SE-Gun tip Resolution: 10 nm Optical microscope Automatic defect review Automatic defect classification Site inspection Automatic defect localization Beam tilt Operator console UPS EPDU FFU Tool cover Isolation block 2005 vintage.
AMAT AMAT / APPLIED MATERIALS SemVision G3 Mask & Wafer Inspection Equipment is an automated system designed to inspect masks, reticles and wafers and detect errors and non-conformances. The unit provides fast wafer scanning capability, allowing for efficient detection of defects on large-scale wafers. The machine is based on a high-speed 6.25 mega-pixel CMOS camera, which is mounted on a proprietary inspection head with supporting hardware and software. It also incorporates a highly accurate motorized stage integrated into the tool with precision machined parts for precise and accurate positioning and movement of the mask and wafer during the imaging and inspection process. The asset is able to detect defects down to 1 micron in size and can inspect an area up to 14 inches in diameter. It is also capable of inspecting multiple wafers simultaneously and can detect both surface imperfections and trace errors in the mask or wafer. In addition, APPLIED MATERIALS AMAT SemVision G3 Mask & Wafer Inspection Model is able to recognize different types of defects including voids, line breaks, missing features and misorientation. The equipment features a programmable image generation and capture software which can be used to customize the imaging processing. This includes the ability to adjust the inspection settings to optimize the results for the application. The software also enables the user to analyze the acquired data and generate detailed reports, which can be used for documentation, quality control, and process improvement. AMAT / APPLIED MATERIALS APPLIED MATERIALS SemVision G3 Mask & Wafer Inspection System is designed to provide precise and accurate inspection performance, while taking into account needs of different manufacturing processes and applications. Its robust design and user-friendly software allow users to inspect and detect defects quickly and accurately, allowing for efficient and reliable high-quality production.
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