Used AMAT / APPLIED MATERIALS SemVision G3 #9182849 for sale
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ID: 9182849
Wafer Size: 12"
Vintage: 2008
Defect review system, 12"
Process: Metrology
Currently warehoused
2008 vintage.
AMAT / APPLIED MATERIALS SemVision G3 is an advanced "mask and wafer inspection" system designed for life science and semiconductor manufacturing applications. It combines advanced hardware and software to provide industry leading image quality and image analysis, allowing for high precision measurements and inspection capabilities. The hardware platforms of AMAT SemVision G3 include a high-resolution camera and custom optics. The optics provide extremely sharp images of up to 5MP resolution. The camera also provides an array of adjustable parameters, such as focus, exposure, gain, and field of view, allowing for precise optimization for unique inspection needs. To provide accurate results, APPLIED MATERIALS SemVision G3 comes with a software suite that includes an advanced image analysis system. The software is capable of automatically analyzing the image for particular features or defects. It can also perform sophisticated 3D analyses, tracking objects throughout multiple images. Additionally, the software offers sophisticated data management options to ensure consistent results. The performance of SemVision G3 is unmatched in terms of throughput, accuracy, and reliability. It can capture up to 150 high-resolution images per second and can measure up to 10 objects. Additionally, the system boasts a measurement repeatability of better than 3 microns, making it ideal for precision measurements. AMAT / APPLIED MATERIALS SemVision G3 is a versatile platform, capable of providing fully automated inspection and analysis of a wide range of features on both mask and wafer level. Its advanced imaging and analysis capabilities make it a premium choice for life science and semiconductor applications. It's intuitive software, reliable results, and fast throughput make AMAT SemVision G3 an invaluable tool in any facility looking for the utmost in imaging accuracy and speed.
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