Used AMAT / APPLIED MATERIALS SemVision G3 #9351468 for sale
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AMAT / APPLIED MATERIALS SemVision G3 Mask and Wafer Inspection Equipment from AMAT is a fully automated and integrated system for inspection of masks and wafers. It is a key part of any full service, production lithography facility. The unit provides both 1- and 2-sided inspections, allowing full mask and wafer inspection. Its double-sided inspection capability helps reduce the overall cost of ownership while enabling unification of the mask and wafer data. AMAT SemVision G3 uses optical and 3-D visual analysis to perform comprehensive analysis of a pattern on a wafer surface. It offers integrated high performance, high resolution and probing in both high and low-NA application modes. Key features of the machine include a 1010 high-precision stage and linear motor drive, a 0.9 nm resolution piezo scanner, a 1600 mm field of view, a 810 nm FOV framing option, and a background elimination scan option. The tool is equipped with an automated mask and wafer aligner, a high-speed controller and an advanced inspection software package. APPLIED MATERIALS SemVision G3 has a low false-alarm rate and provides an efficient way to measure and identify defects in semiconductor devices. It supports a wide range of critical defect types, including particles, particles on back side, contact holes, gateline critical dimensions and overlay. The asset also includes a library of proprietary routines, which can be used to detect and fix defects automatically. SemVision G3 provides a reliable and intuitive user experience, allowing operators to quickly identify and fix defects on both masks and wafers. It is easy to install, configure and operate, allowing engineers and operators to quickly understand how to use the model. The equipment is designed to be used in the most demanding semiconductor production environments, ensuring high-quality results and helping to deliver high-yield performance. In conclusion, AMAT / APPLIED MATERIALS SemVision G3 Mask and Wafer Inspection System from APPLIED MATERIALS is a highly reliable and cost-effective solution for mask and wafer inspection. It provides a variety of key features and advantages, which make it an ideal choice for semiconductor fabrication processes.
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