Used AMAT / APPLIED MATERIALS SemVision G3 #9372771 for sale
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AMAT / APPLIED MATERIALS SemVision G3 is a mask and wafer inspection equipment designed to quickly deliver defect detection and correction. This system combines hardware, software, and processing power to capture, analyze, and correct mistakes in precision device mask images. The hardware of AMAT SemVision G3 comprises several components. At the foundation is a state-of-the-art imaging unit that drives a high-resolution, intelligent CCD camera to capture the image, enabling visualization and analysis of features as small as one micron. This is paired with a repeating triple stage pyramid sensing machine with a built-in linear encoder for precise auto-focusing. An Object Recognition Tool (ORS) uses a range of advanced algorithms to enhance the captured images with heightened contrast and sharpness. The images are then processed and analyzed by the Image Analysis Asset (IAS). Next, the G3 uses several software modules for data processing and error recognition. This includes Segmentation and Classification (SCU), Edge Detection (EDT), and Partition algorithms. These help identify and detect defects, which are then characterized by a variety of measurements including size, shape, position and direction. Finally, a Correction Model (CORR) is used to compare the summary results against stored standards to ensure that the data is within its specified tolerance range. Finally, APPLIED MATERIALS SemVision G3's modular architecture enables a variety of powerful processing capabilities to ensure accurate and consistent results across various production processes. Among these is a matched lithography module, which produces high-resolution images of the IC wafer while minimizing noise generated by the masking step. It also offers high-speed data exchange between its different components to accelerate the masking and inspection processes. Overall, SemVision G3 is an incredibly powerful tool for mask and wafer inspection. It combines advanced image capture, sophisticated image processing and analysis algorithms, and powerful data management capabilities to minimize mistakes in the device masking process. It's sure to be an invaluable asset for achieving consistent and accurate results.
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