Used AMAT / APPLIED MATERIALS SemVision G3 #9389441 for sale

AMAT / APPLIED MATERIALS SemVision G3 is a precision mask and wafer inspection equipment. The system is designed to ensure that all photomasks and wafers are flawlessly fabricated according to manufacturers' specifications. The high-precision unit incorporates all of the state-of-the-art features needed to conduct an accurate inspection, such as an automated wafer alignment machine, an adjustable illumination tool, and SEM technology to detect defects. The asset is designed to accommodate a wide variety of configurations and technologies such as silicon-on-insulator (SOI) technology, strained silicon technology, and 250-nm and smaller feature sizes for ultra-high-resolution imaging. The model utilizes Intelligent Adaptive Scanning Technology (IAST) to optimize the precision of the SEM imaging process. This ensures the highest performance accuracy during the process, quickly and efficiently detecting the smallest defects. AMAT SemVision G3 also includes a defect review station, where multiple images of defects can be easily evaluated by the user. Images can be reviewed side-by-side, along with detailed information for proper data analysis. On-board defect repair systems are available for further enhancement of the image and signal analysis. The equipment is easy to operate, with a simple user interface. It is designed with advanced control software, so that all settings, functions, and protocols can be adjusted in real-time, allowing for customized and optimized wafer inspection performance. APPLIED MATERIALS SemVision G3 offers the flexibility of high-speed scanning and low-speed manual review, as well as the ability to save and review job results. The integrated data acquisition instrument records the system parameters to ensure full compliance with customer needs. SemVision G3 is an effective tool for ensuring the reliability and accuracy of the critical processes of mask and wafer fabrication. The unit enables customers to minimize downtime, improve yields, and reduce the cost of wafer inspection and manufacturing.