Used AMAT / APPLIED MATERIALS SemVision G4 #9308717 for sale

ID: 9308717
Wafer Size: 12"
Vintage: 2011
Defect review system, 12" Main unit Operator console Uninterrupted Power Supply (UPS) (2) Dry pumps External power distribution unit 2011 vintage.
AMAT / APPLIED MATERIALS SemVision G4 is a state-of-the-art equipment for mask and wafer wafer inspection. It offers an unparalleled level of accuracy and detail in automated wafer analysis. AMAT SemVision G4 system provides an inspection range with an extremely high level of flexibility and performance, enabling high-precision analysis of advanced patterns to be performed quickly and accurately. The unit is equipped with a range of high-quality inspection tools, such as a Contrast-Enhancing Filter for visualization and analysis of errors and defects, a Defect Calibration Tool for accurate size and shape determination, and a Specular Reflection Tool for measuring and correction of non-uniformities in the sample patterns. In addition, the 3D Profiler provides an accurate 3D model of patterns and features, as well as a 3D depth measurement tool. APPLIED MATERIALS SemVision G4 machine also has a multi-wavelength tool that provides a wide range of parametric information. This includes simplified wavelength information and improved wavelength measurement, resulting in outstanding discrimination and detection of wafer features. The asset can also be adapted to a variety of surface effects, including a Variable Angle Illumination model that allows high-contrast imaging of irregular patterns. The advanced imaging capabilities of SemVision G4 provide accurate defect identification and high-resolution imaging of sample patterns. In addition, the equipment also offers a variety of high-end automation and analysis tools that further facilitate defect characterization, as well as data processing and reporting. With its combination of high-quality imaging and precision engineering, AMAT / APPLIED MATERIALS SemVision G4 system is a highly advanced and capable device for mask and wafer inspection.
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