Used AMAT / APPLIED MATERIALS SemVision G4 #9401994 for sale

AMAT / APPLIED MATERIALS SemVision G4 is a state of the art, high-tech mask and wafer inspection equipment designed to enable the detection and characterization of micro defects on photomasks and wafers. The inspection system is capable of detecting defects down to a resolution of 6 microns and can be used for a wide range of semiconductor and microelectronics applications. The G4 utilizes confidence driven pattern matching algorithms along with a number of sophisticated image enhancement techniques to enable defect detection. The unit is designed to analyze both front and backside images of wafers and masks, enabling rapid and efficient detection of even the smallest defects. It features an intuitive user interface, allowing users to quickly and easily configure the machine to detect, classify and score defects in both front and backside images. The G4 is equipped with a Xeno Light source and an arc lamp, creating an optimal light source for detecting even the smallest defects. It features two leading-edge CCD cameras that use a high resolution lens to capture images of masks and wafers. Utilizing powerful image analysis algorithms, the tool is capable of detecting and characterizing microscopic defects on masks and wafers. The G4 includes a range of sub-micron defect detection algorithms, such as DRC (Direct Registration of Characters) for efficient matching of sub-micron structures. It also has a pixel-level defect review algorithm that allows the user to drill down on suspicious defects and view them in detail. AMAT SemVision G4 is an indispensable tool for semiconductor and microelectronics production, providing a fast and reliable way to detect and characterize defects on photomasks and wafers. With its advanced imaging algorithms, powerful light source and intuitive user interface, the G4 sets the standard for mask and wafer inspection systems.