Used AMAT / APPLIED MATERIALS SemVision G4 #9408877 for sale

AMAT (APPLIED MATERIALS) AMAT / APPLIED MATERIALS SemVision G4 is a highly advanced mask and wafer inspection equipment, designed to deliver unparalleled performance in both defect detection and signal integrity analysis. The G4 employs advanced signal processing and imaging technology to precisely analyze and inspect masks and wafers with the utmost accuracy. This system captures destructive and non-destructive images of mask and wafers, while simultaneously capturing image-width and image-length data of both masks and wafers. AMAT SemVision G4 offers high-resolution line-by-line scanning of masks and wafers, across a wide coverage range of defects that range from smallest to the largest critical features. It also features spectral imaging of samples using broadband or narrowband illumination. The unit can detect monocrystalline, polycrystalline, as well as noncrystalline materials/devices. It also provides defect density measurement and classification capabilities. Moreover, the G4's advanced in-line metrology automation capabilities enable it to rapidly scan, measure, and identify semiconductor process-related defects without human intervention. It offers the user advanced imaging features for the detection and dimensional analysis of structures with small features, such as die pads and solder bumps. The G4 also offers advanced software tools to enable predictive diagnostics, allowing rapid fault localization. APPLIED MATERIALS SemVision G4 offers advanced computer assisted defect recognition (CADR) functionality. It uses advanced algorithms to detect defects with repeatable accuracy and can classify and/or qualify defects depending on their shape, size, color, contrast, intensity, etc. CADR eliminates the need for tedious manual defect sorting and identifies potentially critical defects. Overall, SemVision G4 is a powerful and efficient mask and wafer inspection machine, designed to meet the highest standards of accuracy, speed and reliability. It is an ideal tool for failure analysis, inspection, production test and process improvement.