Used AMAT / APPLIED MATERIALS Semvision G5 + EDX #9145244 for sale

AMAT / APPLIED MATERIALS Semvision G5 + EDX
ID: 9145244
Wafer Size: 12"
Vintage: 2011
Defect review system, 12" 2011 vintage.
AMAT / APPLIED MATERIALS Semvision G5 + EDX is a mask and wafer inspection equipment designed for semiconductor fabrication. This system offers a reliable and efficient method of ensuring that the masks and wafers used in manufacturing products are of the highest quality. The unit uses a variety of detectors and imaging techniques to rapidly and accurately examine the masks and wafers for flaws, distortions, and other imperfections. AMAT Semvision G5 + EDX consists of a mask inspection module, an optical microscope, a charge-coupled device (CCD) array, an electron detector, and a sample holder. The mask inspection module utilizes a high-resolution camera and a high-power light source to capture microscopic images of the mask. The optical microscope is used to visually inspect the mask and wafer for flaws and imperfections, while the CCD array is used to collect digital images of the mask. The electron detector is used to capture and analyze nano-scale elements in the masks and wafers. The sample holder is designed to securely hold the masks and wafers during inspection. APPLIED MATERIALS Semvision G5 + EDX also utilizes a number of computer-based analysis tools and software designed to quickly and accurately assess the masks and wafers. This includes automated defect inspection software, which is designed to detect and identify defects in the masks and wafers. Additional software tools are also included that are designed to check for compliance with established international standards. Semvision G5 + EDX offers a unique combination of speed, accuracy, and affordability that make it an attractive choice for semiconductor fabrication shops looking to improve the accuracy and efficiency of their mask and wafer inspection processes. This machine is capable of capturing high-resolution images at a speed of up to 6,000 frames per second and can detect imperfections as small as 0.15 microns. Furthermore, the tool can be easily integrated into existing production lines, allowing for a faster time-to-market.
There are no reviews yet