Used AMAT / APPLIED MATERIALS SemVision G5 HP #9408836 for sale

ID: 9408836
Vintage: 2013
Defect review system 2013 vintage.
AMAT / APPLIED MATERIALS SemVision G5 HP is a high-performance metrology equipment specifically designed to enable thorough mask & wafer inspection to be conducted at wafer fabs. The system is capable of inspecting a variety of different materials, including surfaces, layers and substrates, making it ideal for a range of analyses and wafer-level measurements. AMAT SemVision G5 HP is driven by an advanced five-axis movement unit that enables high-precision imaging and inspection of masks and wafers. The machine is equipped with a powerful optical condenser and imaging lenses that operate at a wide range of magnifications. The integrated high-resolution CCD enables clear and detailed imaging of fine mask and wafer topography, giving accurate results in the presence of chemical or environmental conditions. APPLIED MATERIALS SemVision G5 HP features advanced automated air-bearing motion control for faster, more repeatable measurements and improved quality management. Automated image analysis is also provided by the software, as well as an integrated super-resolution microscope for inspecting features at the nanoscale. Flexible measurements can be taken via the automated quality control and defect inspection capabilities, and a variety of standard and optional surface scanning, imaging and video acquisition options are available. The tool also offers intuitive workflows through its graphical user-interface and hardware capability modules, making it easier to generate and analyse accurate results quickly. With the ability to collect and store datasets, it is also possible to identify potential issues and optimise product quality. Overall, SemVision G5 HP is a highly capable metrology asset that offers premium performance and reliable inspection capabilities. Its easy-to-use design, automated functions and range of versatile features make it an ideal choice for wafer fabs looking to accurately and efficiently inspect masks and wafers.
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