Used AMAT / APPLIED MATERIALS SemVision #9170210 for sale

AMAT / APPLIED MATERIALS SemVision
ID: 9170210
SEM - Defect review.
AMAT / APPLIED MATERIALS SemVision is a mask and wafer inspection equipment designed to inspect and accept or reject semiconductor components. It uses advanced optical imaging and pattern recognition technology to automatically inspect, measure and classify wafer structures, defects and process-related features with high accuracy. The system is designed to perform automatic electrical testing of the components, including current-voltage curves, CV measurements, ESD, leakage and yield analysis. AMAT SemVision features a custom layout design with dualstage operator station providing user ergonomics, together with automated generation of accurate defects and process information. Furthermore, the unit supports unique measurement algorithms, such as analytical curve fitting and advanced colorimetry, as well as feature extraction using artificial intelligence techniques. The machine is able to process wafers from 10mm to 500mm with consistent accuracy, as it provides high resolution imaging, as well as high precision process measurement. It is composed of a modular, multichannel inspection station and an automated defect classification module. On the other hand, the inspection station is equipped with a quad-il optics, that outputs multiple images simultaneously and a CCD camera, that captures those images. Moreover, APPLIED MATERIALS SemVision features a comprehensive software platform, that is responsible for the generation and processing of high resolution images, as well as the intelligence algorithms used for pattern recognition and defect classification. Its graphical user interface allows the operator to easily and intuitively configure the tool and select from several pre-programmed inspections, using wizards, graphical representations, or advanced customization tools. SemVision provides a comprehensive workflow, allowing results to be quickly retrieved, reviewed and shared. Moreover, the asset is supported by several third party tools, such as off-line inspectors, EDA systems, or process control monitors. In conclusion, AMAT / APPLIED MATERIALS SemVision is a highly reliable mask and wafer inspection model capable of performing automatic electrical testing and providing accurate results with high throughput. Its modular design and intuitive user interface allows users to quickly configure, analyze and accept/reject semiconductor components.
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