Used AMAT / APPLIED MATERIALS SemVision #9179929 for sale

AMAT / APPLIED MATERIALS SemVision is a mask and wafer inspection equipment that combines the latest in image analysis and optics technologies to ensure that a high level of uniformity and fidelity is maintained in the fabrication of integrated circuits. It is designed to provide fast, accurate analysis of wafer and mask processing. AMAT SemVision system uses advanced optics, advanced-processing algorithms and multi-spectral imaging to inspect wafers and masks for uniformity and fidelity. It is a highly sensitive instrument that can detect the subtlest patterns and variations in the structures such as line widths, etch depth, uniformity, and factor of defect. The vision unit is a comprehensive inspection machine that can quickly analyze a wide range of processes in complex masks and wafers. The tool is equipped with a combination of high-resolution cameras, built-in high-end optics, powerful yet efficient computational capabilities, as well as advanced image processing technologies that are all encapsulated into an integrated asset. It can collect both high-resolution images and stereo data of a voluminous amount of images to be analyzed within just a few seconds. APPLIED MATERIALS SemVision model is designed with a two-step process that allows it to ascertain and measure the uniformity and accuracy of the masks and wafers. Before analysis, the equipment preforms a set of initial tests to gain an overall understanding of the wafer or mask's qualifications. Once this is accomplished, the system begins its inspection by simultaneously collecting data on the full range of image parameters. These parameters are compared to the baseline parameters of a design drawing to identify discrepancies and examine patterns for uniformity across the field of view. The depth and quality of the inspection using SemVision are unmatched in their efficiency, accuracy and the quality of their results. The entire inspection process is automated, and the results are robust and reliable. With AMAT / APPLIED MATERIALS SemVision, defects that could have gone undetected with traditional inspection techniques become detectable and quickly diagnosed. As such, this unit is becoming increasingly adopted by integrated circuit manufacturers and research centers.