Used AMAT / APPLIED MATERIALS SemVision #9226926 for sale

AMAT / APPLIED MATERIALS SemVision is a sophisticated mask and wafer inspection equipment designed for semiconductor manufacturing. It features advanced optics and superior system performance capabilities for superior image quality on a variety of substrates. The unit is able to inspect wafer substrates with feature sizes as small as 100nm. With its advanced optics and high resolution, it can detect defects down to 0.25 micron and with a variable magnification up to 500x. The machine features a scanning electron microscope (SEM) equipped with a powerful x-ray detector, making it well-suited for imaging through thin films, such as membranes. In addition, it includes a pattern recognition subsystem to enable automated defect detection and classification. The inspection tool also incorporates innovative detection and classification algorithms to enable the detection of subtle defects that are difficult to detect by conventional techniques. The asset can also detect particles, pimples, and particles. In addition, it includes powerful image processing capabilities that enable high throughput, enabling production line speeds of up to 300 wafers per hour. The model also has additional features including laser alignment forautomatic die registration, an operator interface for easy operation, and adjustable SEM accelerating voltage for detailed feature detection. The equipment is designed for high-volume production with low yield-loss rates. Through its high speed, high quality imaging, the system provides cost savings through decreased maintenance costs and increased device yields. In conclusion, AMAT SemVision is an advanced mask and wafer inspection unit developed for semiconductor manufacturing. It features advanced optics, superior machine performance, and highly sensitive imaging capabilities for superior image quality. Its powerful image processing capabilities increase throughput and yield rates, resulting in cost savings.