Used AMAT / APPLIED MATERIALS SemVision #9256560 for sale

AMAT / APPLIED MATERIALS SemVision Mask & Wafer Inspection Equipment is a comprehensive, high-throughput solution designed to help semiconductor manufacturing and other related industries enhance overall production yield, throughput and quality. Utilizing advanced optical recognition and imaging, the system is capable of accurately analyzing semiconductor patterns and identifying potential defects. The unit is designed to optimize the inspection process by rapidly and accurately detecting both slow and fast-moving defects. This is accomplished through several dynamic inspection sequences that can be configured to provide repeatable results. Features of the machine include both their advanced suite of image-based defect detection algorithms and their advanced defect inspection technique. The tool provides an automated, real-time approach to wafer inspection and provides analysis results that are reliable and repeatable. The Mask & Wafer Inspection Asset from AMAT features a high-resolution digital imaging model, as well as digital image enhancement technology. This allows for extremely high-precision pattern inspections, defect detection, and component value measurement. With automated feature recognition and analysis, the equipment can quickly identify anomalies or defects. The system also features advanced alignment and corrections capabilities, allowing it to effectively analyze patterns with sharp edges and highly sensitive structures. The unit also provides powerful edge detection capabilities, allowing it to recognize and isolate the desired patterns. Additionally, the machine is designed with capabilities for antifouling inspections. This involves analyzing wafers for common environmental contaminants, such as pike, abrasion and mold growth. In addition to these capabilities, the tool also helps to reduce inspection time by eliminating the need for manual scanning in an effort to improve productivity and reduce costs. Overall, the Mask & Wafer Inspection Asset from APPLIED MATERIALS is designed to improve the production yield and product quality. By providing rapid, accurate, and repeatable inspection performance, the model increases the likelihood that faulty or defective devices are identified and replaced early in the production cycle, thus resulting in improved yields, increased efficiency and cost savings.