Used AMAT / APPLIED MATERIALS SemVision #9308059 for sale

AMAT / APPLIED MATERIALS SemVision Mask & Wafer Inspection Equipment is a fully automated, semiconductor metrology tool designed to reliably detect defects in both masks and wafers. The system utilizes two manufacturers, Nikon and Schneider Optical Technologies, allowing users to choose between moderate and high magnification. It also offers various measurement types such as optical reflectivity, edge roughness, radial geometric distortion, and more, making it ideal for both research and production applications. The unit has two main modules, a Machine Controller Module and an Image Capture Module, each with its own set of features. The Tool Controller Module is the brain of the asset, responsible for managing all the model operations, from acquiring images to analyzing data. It is composed of a unit control software, an imaging console, and a semiconductor control terminal. Additionally, it features control panels for controlling the operation settings and a PC connected to the equipment over USB. The Image Capture Module consists of three main components: a microscope, a microscope adapter, and a camera. The microscope is used to provide magnification and detailed imaging, while the adapter connects directly to the camera and helps to ensure that the images are accurately captured and analyzed by the system. The microscope includes both a field of view selection and a selection of optical parameters including resolution, field of view size, and depth of field. The microscope also offers a variety of imaging modes to suit various applications, such as brightfield, darkfield, polarization, and more. The camera is a high-resolution digital imaging unit that capture images at up to 4K resolution. The machine's image processing software enables users to measure various characteristics of the wafer and masks. The software can detect defects on the wafer and masks, as well as measure their radial distances and areas in order to assess their level of accuracy. Additionally, it can be used to measure optical characteristics, such as scratches, scratches on specific features, features smoothing or deviation, and other details. The software also offers image processing and analysis algorithms for automatic defect detection, feature extraction, and a variety of other purposes. AMAT SemVision Mask & Wafer Inspection Tool is an efficient tool for ensuring the highest possible quality of the semiconductor manufacturing process. Its ability to accurately detect defects and measure various characteristics of the wafer and masks make it an ideal choice for both research and production applications.