Used AMAT / APPLIED MATERIALS UVision 200 #293587883 for sale

AMAT / APPLIED MATERIALS UVision 200 is an automated mask and wafer inspection equipment designed for semiconductor manufacturers. It uses high-resolution, full-field optical imaging to detect defects on masks and wafers with a maximum size of 8 inch (200mm). The system is capable of inspecting both thick and thin masks with a resolution of up to 0.36 microns. It also offers a wide range of defect detection capabilities including dark-field illumination, bright-field illumination and differential imaging. The unit is equipped with a user-friendly, touchscreen interface with multiple setup options. It supports various image capture modes, including manual, semi-automated, and fully automated inspection. It utilizes several advanced image processing algorithms such as defect filter, defect type filter and automatic defect classification, to accurately identify potential defects. It also features 3D image display capability for analyzing complex defect structures. Other features include an ergonomic specimen stage for easy specimen loading and recipe control for process optimization. AMAT UVision 200 provides a modular lens machine for different acquisition angles and resolutions. It supports a wide range of optics such as S-Lenses, T-Lenses, and F-Lenses, which offer different performance levels for imaging and non-imaging applications. The tool is also compatible with a wide variety of probes and sensors for more precise detection of defects. The asset conforms to U.S. MIL-STD and ISO standards, ensuring reliable operation and repeatable results. It also supports a wide range of software tools, including integration with industry-standard data base systems, which allow users to monitor and analyze inspection data. Additionally, the model can be upgraded with various optional hardware and software upgrades, enabling continuous optimization of the inspection process. In conclusion, APPLIED MATERIALS UVision 200 is a versatile and powerful automated mask and wafer inspection equipment designed to meet the needs of semiconductor manufacturers. It offers a range of advanced imaging, defect detection, and data analysis capabilities, as well as robust compatibility and upgradability, making it an ideal solution for effective and timely quality control.