Used AMAT / APPLIED MATERIALS UVision 200 #293759036 for sale
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ID: 293759036
Wafer Size: 12"
Vintage: 2006
Brightfield inspection system, 12"
2006 vintage.
AMAT / APPLIED MATERIALS UVision 200 is a next-generation, mask and wafer inspection equipment that enables precise image quality assurance for the production of integrated circuits. The high-resolution imaging system combines optical and scanning electron microscopy to provide comprehensive, three-dimensional imaging and defect analysis. The unit's optical microscopy module combines bright field and dark field imaging techniques with two 20X objectives, one 100X and two 200X. This feature enables a variety of imaging conditions and the ability to reveal defects in the most intricate of patterns. Automated image navigation can be used to identify and accurately measure defects from 10nm to 500,000nm. The machine's high-resolution scanning electron microscopy (SEM) module provides an extended depth of field, enabling observation of features up to 1 million nm². It also features a variety of automated navigation options to quickly and easily examine large regions for defect analysis. Combined with STEM capability, AMAT UVision 200 can offer detailed analysis of minute structures, such as buried features. APPLIED MATERIALS UVision 200 has an array of tools to ensure reliable data capture and reporting. Its automated imaging and reporting tools enable consistently accurate results by using pre-defined settings. Moreover, the tool has low-coherence filter algorithms for accurate phase analysis and advanced image enhancement functions such as multi-frame tracking,defect-tracking,and cross-sectional views,all of which enable more comprehensive analysis of multi-layer patterns. In addition, UVision 200 offers a variety of asset management features, enabling users to maximize process efficiency. It features a built-in wafer loading and inspection method that is customizable to meet customer applications. Moreover, the model can be configured to automatically trigger corrective actions when pre-defined conditions are met, resulting in faster throughput times and higher uptime. Engineering productivity is further enhanced with AMAT / APPLIED MATERIALS UVision 200's intuitive, customer-friendly evaluation software. The software includes drawing and report generation features that allow users to easily review their results, and report items are saved securely in user-accessed databases for archiving purposes. In conclusion, AMAT UVision 200 is an advanced mask and wafer inspection equipment that offers an unmatched combination of imaging and analysis capabilities. Its superior optical and SEM technology enables thorough defect analysis, and its powerful system management features maximize productivity.
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