Used AMAT / APPLIED MATERIALS UVision 200 #9257412 for sale

AMAT / APPLIED MATERIALS UVision 200 is a mask and wafer inspection equipment designed to provide precise, reliable analysis for quality control of semiconductor device fabrication. The system is capable of detecting many types of contamination, such as particles, dirt, dust, debris, and scratches. To ensure accuracy and clarity of the data collected, the UVision comes equipped with an optical imaging unit that utilizes optical light sources such as UV/VIS lasers. This extends the capability to detect contaminants that can be seen in both optical and non-optical wavelengths. The imaging capabilities also extend the machine's range of detectable defects from the top surface down to a depth of 6 microns. The UVision comes with specialized software which enables users to analyze and review images quickly and easily. Through this interface, users can study defect maps and magnify images to get a closer look at the inspected objects. Furthermore, the software allows automated review operations and efficient report storage, making it easier to track and compare patterns between inspections. In addition to the inspection tool itself, AMAT UVision 200 offers an industrial vision solution to improve the efficiency of the inspection process. This includes features such as automated alignment and edge detection to ensure accurate inspections. Automated trace inspection also allows users to measure the thickness of sample parts. The reliability and accuracy of APPLIED MATERIALS UVision 200 make it an ideal tool for quality control of semiconductor device fabrication. With its specialized optical imaging asset and intuitive software, the UVision provides users with an effective way to detect particles, dirt, dust, and other contaminants. Additionally, the model's vision solution helps ensure that aligned parts are quickly and accurately inspected. This combination of features makes it a great choice for semiconductor device manufacturers.