Used AMAT / APPLIED MATERIALS UVision 4 #293648402 for sale

ID: 293648402
Vintage: 2010
Brightfield inspection system 2010 vintage.
AMAT (APPLIED MATERIALS) AMAT / APPLIED MATERIALS UVision 4 is a state of the art mask and wafer inspection equipment. It is designed to increase throughput, reduce scrap and improve quality inspections during semiconductor production processes. The system offers automated, localized pattern, defect and overlay inspections, as well as automated post analysis capabilities. The inspection unit utilizes the latest in imaging technology, combining a combination of high resolution, back-illuminated, color camera with a wide range of UV and visible light sources. This enhances the device's ability to detect and identify defects, such as slits, pinholes, shorts, and voids. The incorporation of the advanced imaging metrology allows for a comprehensive, easy to use, and accurate inspection. AMAT UVision 4 offers up to five times better than traditional inspection systems, and provides an unparalleled level of accuracy and repeatability. The machine also features an intuitive touchscreen user interface and various connectivity options, ensuring an easy installation or upgrade. Furthermore, APPLIED MATERIALS UVision 4 is also fully scalable and configurable, allowing users to tailor the tool to their specific needs. UVision 4 also features an advanced suite of defect detection and analysis algorithms to ensure accurate and repeatable performance. These algorithms work in tandem to detect a wide variety of defects, including those related to lithography pattern fidelity, defects related to irregular pattern shapes and shapes related to surface contamination. AMAT / APPLIED MATERIALS UVision 4 is a powerful and efficient tool for semiconductor manufacturers looking to improve their product quality, reduce scrap, and increase throughput. It offers advanced imaging capabilities, automated defect and overlay inspections as well as post analysis, scalability, and configurability, making it an ideal choice for a wide range of mask and wafer inspection needs.
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