Used AMAT / APPLIED MATERIALS UVision 4 #293665708 for sale

AMAT / APPLIED MATERIALS UVision 4
ID: 293665708
Wafer Size: 12"
Brightfield inspection system, 12".
AMAT / APPLIED MATERIALS UVision 4 Mask and Wafer Inspection Equipment is a state-of-the-art imaging system designed for a variety of semiconductor and integrated circuit (IC) fabrication processes. The unit combines brightfield and darkfield inspection and cutting-edge alignment analysis algorithms to ensure the highest level of yield in semiconductor and wafer fabrication. The machine enables non-destructive defect inspection, providing detailed images of the surface topography, as well as the potential failure sites within any mask or wafer. The tool includes advanced image processing algorithms which allow it to identify even the smallest potential defect sites that would otherwise be missed. The asset is also capable of inspecting and distinguishing between fine patters and defects at two different depths within a single component, allowing for high-quality inspection of each layer of a mask or wafer. The model features high-resolution digital imaging and intuitive user interface which allow users to quickly and easily perform various types of mask and wafer inspection. Supported features include; die-to-die defect inspection, pre-scanned inspection, full wafer mask inspection, spot defect inspection, and copy mask inspection. Additionally, it can evaluate multiple die geometry parameters such as pitch, area, line/space, overlap, shape and placement. Furthermore, AMAT UVision 4 is equipped with a mask alignment equipment which allows for simultaneous matching of up to two reference masks and one target mask. This ensures accuracy and repeatability in the inspection process. The system can be operated from any web browser, Windows or UNIX operating unit and is provided with an extensive library of automated Mask Inspection Machine (MIS) commands to support automated operation. In addition, the device features patented auto-correction algorithms to minimize inspection time by reducing the need for manual adjustment of the tool. The outstanding features and functionality of APPLIED MATERIALS UVision 4 Mask and Wafer Inspection Asset make it an essential tool for advanced semiconductor and integrated circuit fabrication processes. The model enables faster and more accurate identification of defects, resulting in improved yield and throughput in manufacturing environments.
There are no reviews yet