Used AMAT / APPLIED MATERIALS UVision 4 #9229127 for sale

AMAT / APPLIED MATERIALS UVision 4 is an advanced mask and wafer inspection equipment used in the semiconductor industry. It incorporates high-speed, high-resolution imaging that accurately inspects patterns produced by lithography. AMAT UVision 4 utilizes a proprietary SuperLens to obtain greater depth of field and sharper imagery than preceding systems. This enables defect detection and analysis from the factory floor. The system features an automated mask inspection capability, which accurately inspects reticles without adjusting focus or alignment. In a single scan, the unit can detect a variety of defects, including missing layers and linewidth non-uniformity. With the addition of the CCD camera, the machine is able to detect incoming patterns from reticles as small as 0.5 micron line widths. APPLIED MATERIALS UVision 4 is equipped with high-performance optics, which provide wide inspection coverage for quick, accurate analysis. The tool utilizes an advanced camera asset, which offers real-time imaging and reconstruction capabilities. A 360-degree camera provides a full view of the mask or wafer, making it possible to detect defects more quickly and accurately. UVision 4 is equipped with advanced software for precise defect detection and analysis. The model is capable of distinguishing between dielectrics and defects, making it easy to identify and measure defects and ensure manufacturing quality. The user-friendly software allows engineers to quickly and accurately analyze defects. AMAT / APPLIED MATERIALS UVision 4 is efficient and cost-effective, requiring minimal maintenance and no lengthy setup times. The operability and flexibility of the equipment make it ideal for production lines of varying sizes and complexities. The system is expandable and upgradable, ensuring that it can meet the needs of future generations of semiconductor fabrication. AMAT UVision 4 is a powerful mask and wafer inspection unit for the semiconductor industry. Utilizing advanced SuperLens optics for excellent depth and resolution, APPLIED MATERIALS UVision 4 is capable of detecting a variety of defects in reticles as small as 0.5 microns. It is equipped with high-performance optics, automated mask inspection, advanced camera machine, a 360-degree camera, and user-friendly software for precise defect detection and analysis. Efficient and cost-effective, it requires minimal maintenance and no setup times, and is expandable and upgradable for use in future semiconductor processes.