Used AMAT / APPLIED MATERIALS UVision 5 #9064274 for sale

AMAT / APPLIED MATERIALS UVision 5 is a mask and wafer inspection equipment designed to ensure the highest level of accuracy and performance in semiconductor manufacturing. AMAT UVision 5 is designed to exacting specifications, and is tailored to meet the specific needs of semiconductor manufacturers. The system covers the entire wafer surface and features a new generation of advanced optics, an integrated image capture unit, and an intuitive graphical user interface. APPLIED MATERIALS UVision 5 is equipped with an electrically scanned stage to scan both wafers and masks without any vertical movement. The wafer can be scanned in an arc pattern, circle pattern, or in a linear scanning direction to cover the full wafer surface. The scanner is able to accurately check the edges and corners of the mask or wafer, while at the same time being capable of providing repeatable and reproducible measurements. The advanced optics utilized on UVision 5 provide very detailed imaging capabilities. The microscope has a maximum resolution of 2 nm. The optics module includes separate illumination channels to provide optimum performance and image processing capabilities. High-definition image capture is also available, allowing for detailed visual inspection of the wafer or mask. The integrated image capture machine of AMAT / APPLIED MATERIALS UVision 5 consists of a camera, light source, and control unit. The camera can capture images in high definition and contains an extra-wide focal plane array of a sophisticated dielectric multilayer interference filter tool allowing for increased sensitivity. The light source is also controllable and can be adjusted according to the application needs. The graphical user interface of AMAT UVision 5 is intuitive and easy to use. It is designed to simplify the operation of the asset and reduce the user's guesswork in positioning the wafer or mask for inspection. The software also includes a library of preset images and spatial analysis tools to aid the user in analyzing defect locations and identifying defects. In conclusion, APPLIED MATERIALS UVision 5 is a dedicated wafer and mask inspection model designed to deliver unparalleled accuracy and performance in the semiconductor manufacturing scene. Its advanced optics, integrated image capture equipment, and intuitive graphical user interface provide users with the ability to easily inspect and analyze wafers or masks, helping ensure they meet the exacting specifications required in the semiconductor industry.