Used AMAT / APPLIED MATERIALS UVision 5 #9219645 for sale

AMAT / APPLIED MATERIALS UVision 5 equipment is a microelectronics mask and wafer inspection application solution that is designed to enable engineers to detect defects and potential yield loss for a variety of circuits. It offers high-throughput defect analysis for process visibility and yield optimization. AMAT UVision 5 system works by bringing together optical, electrical, and automated review capabilities into a single platform. This allows engineers to analyze mask and wafer characteristics quickly and with greater accuracy. It offers a fully automated defect inspection and review process with real-time intelligence and flagging of potential defects. The unit also provides detailed reports about the inspection process, allowing engineers to quickly determine the source and nature of the issue. The inspection process is powered by a combination of visual light, including blue light for visual and near-IR imaging, and darkfield microscopy. This allows for precise and rapid defect detection and inspection. The automated review process uses an artificial intelligence-driven algorithm to interpret the optical characteristics and identify defects. This allows for improved throughput and accuracy. In addition, APPLIED MATERIALS UVision 5 machine offers sophisticated defect classification and measurement capabilities which allow for fast analysis and discrimination of defects. It supports advanced measurement operations such as line width measurements, pitch measurement, and overlay/alignment inspections, enabling engineers to accurately review the circuit layout and its characteristics. The tool also allows for advanced defect classification operations such as image frequency analysis, defect clustering, wafer pattern recognition, and critical area analysis. UVision 5 asset offers a complete package of reliable and cost-effective tools to help engineers and technicians troubleshoot their products and maximize their production yields. It is compatible with a variety of interfaces, delivering a comprehensive suite of inspection capabilities for a variety of applications.