Used AMAT / APPLIED MATERIALS UVision 5 #9375213 for sale

AMAT / APPLIED MATERIALS UVision 5
ID: 9375213
Brightfield inspection system.
AMAT / APPLIED MATERIALS UVision 5 is a workhorse in the world of mask and wafer inspection. It offers reliable and versatilemask and wafer inspection in a highly automated equipment, with a short learning curve. This tool utilizes 355 nm UV laser light and a 6 circular CCD camera that enables wafer review at magnifications up to 3000X. This tool provides a precise review of the large wafer maps, increasing the speed of pattern recognition and decreasing false rejections. In addition to helping identify design rule violations, the system applies auto-classify algorithms to ensure efficient, reliable pattern recognition. This tool also includes flexible pre-configured sub-field areas that enable detailed smaller feature review over a larger area that can help target specific yield-related hot spots. AMAT UVision 5 is a very versatile tool, capable of inspecting a wide variety of different substrate geometries. It is capable of inspecting distinct patterns in non "square" chips as well as structures such as gate sidewall structures with ease. In addition to detecting pattern defects, it is also capable of looking for defect anomalies such as random noise, fuzzy edges, and line width variation. The unit also features automatic and manual defect classification capabilities, giving both the user and the defect detection machine a better understanding of device related errors. The tool also features automated focus calibration and drift adjustment, allowing for patterning alignment and consistent performance for 10-sigma repeatability at sub-nm resolutions. The automated feature also eliminates user-defined settings and drastically reduces manual tuning, enabling more consistent and repeatable measurements. The asset's interface is also easy to use, featuring a user-friendly GUI that supports easy pattern review, annotation, and selection. It also offers complete operations and quality control functions right from the desktop. In conclusion, APPLIED MATERIALS UVision 5 model is a reliable and versatile tool designed for mask and wafer inspection in today's semiconductor manufacturing facilities. It provides precise pattern review and defect detection capabilities, and automated settings for reliable measurements. Additionally, the user-friendly GUI provides easy pattern review, annotation, and selection.
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