Used AMAT / APPLIED MATERIALS UVision 5 #9390690 for sale

AMAT / APPLIED MATERIALS UVision 5 is a revolutionary mask and wafer inspection equipment that has been designed to deliver superior performance, accuracy and reliability in the semiconductor fault isolation, process optimization and yield management processes. The system comprises of an automated configurable integrated moving optical microscopy (MOM) unit, providing a performance edge for process monitoring, fault isolation and yield enhancement. The machine is sensitive to 5 nm defect sizes and provides real-time measurements of printed defects and line widths, assuring superior process control for producing ultra-fine component geometry, tight tolerance line widths and defect detection. The optical microscope design from AMAT UVision 5 consists of a patented moving optical microscope (MOM) onto an XYZ stage, resulting in automated integrated two-dimensional (2D) inspection and automatic focus adjustment, depending upon the application. The instrument also incorporates a patented auto-alignment technique, providing utmost clarity, as well as accuracy of wafer registration. This ensures that misalignment of front-side and back-side inspection features, is avoided. During operation, the platform places a wafer on top of an MOM window, and the MOM moves through and around the wafer at high sped. An imaging tool works in conjunction with the MOM and produces highly detailed, enhanced images which is then studied or compared to the library of known good or bad designs. APPLIED MATERIALS UVision 5 offers a fast throughput and can be operated in a stand-alone environment, enabling users to decrease co-site troubleshooting time and optimize yield management protocol. A wide-area measurement capability and submicron measurements, up to 5 microns, provide exceptional capabilities for process optimization. Finally, highly adept defect-recognition and review keep manual efforts to a minimum, and further simplify the analysis process. UVision 5 asset offers superior versatility, accuracy and reliability for semiconductor fault isolation, process optimization and yield management processes. Utmost clarity in the images and accuracy of wafer registration ensure that design features and patterns are efficiently processed, resulting in a satisfactory end-result. Thus, AMAT / APPLIED MATERIALS UVision 5 is the ideal mask and wafer inspection model to meet the most demanding challenges in the high-end semiconductor industry.